DISEÑO E IMPLEMENTACIÓN DE UN SISTEMA DE MEDICIÓN COMBINADA DE 4-PUNTAS

Francisco Javier Arizaga Ayala, Arturo III Espinoza Duarte, José Antonio Gallardo Cubedo, Armando Gregorio Rojas Hernández

Resumen


Resumen

Se ha desarrollado un sistema con diseño automatizado por medio de software para la medición de resistividad de materiales, en este caso semiconductores, por medio de la técnica de 4 puntas. El método Rymaszewski es utilizado para eliminar la dependencia geométrica de las muestras y sólo configurar la posición de las puntas conforme al método. Los resultados de resistividad obtenidos para las muestras CdS, PbS y ZnO son 11.8x106, 7.7x106 y 5.3x106 Ω.cm, respectivamente. Las películas han sido crecidas por síntesis y con grosores diferentes lo cual resultará en pequeñas pequeñas diferencias entre los resultados obtenidos y los resultados en la literatura: la síntesis del CdS y PbS ha sido por el método de depósito en baño químico (CBD, por sus siglas en inglés) y el ZnO por el método de depósito de capas atómicas (ALD, por sus siglas en inglés). 

Palabras Claves: Cuatro puntas, Método Rymaszewski, resistividad, semiconductor.


DESIGN AND IMPLEMENTATION OF A COMBINED 4-POINT MEASUREMENT SYSTEM

Abstract

A software-automated system has been developed to measure the materials resistivity, in this case semiconductors, by the four point-probe technique. We neglected the sample geometry by using the Rymaszewski method but positioned the probes carefully according to the method. The resistivity results obtained for the samples CdS, PbS and ZnO are: 11.8x106, 7.7x106 & 5.3x106 Ω.cm, respectively. The thin films have been grown by different synthesis and thickness that means that the resistivity results will show some differences between the results obtained and the results in the literature: The CdS y PbS samples was grown by Chemical bath deposition (CBD) method and the ZnO sample was grown by Atomic Layer Deposition (ALD) method.

 Keywords: Four point-probe, Rymaszewski method, resistivity, semiconductor.


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Referencias


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